April 2010 - Bnc-grads-list

Material Characterization Workshop at UIUC--Only $65.00
by John Wilcox 22 Apr '10

22 Apr '10

Dear Grad students, There will be an excellent Material Characterization Workshop at UIUC, June 9-10. This workshop is only $65.00. NSAC To: Caitlin B Burger <cbburger(a)purdue.edu>, John Wilcox <jrwilcox(a)purdue.edu>, Alfredo Tuesta atuesta(a)purdue.edu Hello, I wanted to pass this along to you and to all the NSAC Students but I don’t know all their emails. I will be attending this Material Characterization workshop as well but I will be there from June 8-10. Aamer will also be attending Hopefully the word will get out and Purdue can have a presence at the Workshop. Thank you for sharing this workshop information with the NSAC Students. ~ Monica M. Cortez Allain, Ph.D. ~ ************************************************************ Monica M. Cortez Allain, Ph.D. Managing Director Birck Nanotechnology Center 1205 W. State Street West Lafayette, IN 47907-2057 Phone: (765) 494-5138 Fax: (765) 496-8299 ************************************************************ -- John Wilcox jrwilcox(a)purdue.edu Purdue University School of Electrical and Computer Engineering Cell: (801)830-4566 Office: (765)496-1029

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Thesis presentation on Tuesday (04/20) @12:00pm in BRK 2001
by Ehtesham Islam 19 Apr '10

19 Apr '10

Dear All, I will be taking my Ph.D. Final Exam on Tuesday (04/20) at 12:00pm in BRK 2001. Hope to see you all there during the presentation. The title and the abstract of my thesis is provided below. Thanks. - Ehtesham Title: Theory and Characterization of Random Defect Formation and its Implication in Variability of Nanoscale Transistors Abstract: Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of transistor, which is one of the basic building blocks in almost all the modern electronic devices. However, nanoscale dimension of current transistors following Moore's law have shifted the spotlight from carrier transport towards the reliability and variability constraints. Modern transistors operate with high electric field. They also use small metal gates and high- κ gate dielectric. Therefore, these transistors regularly suffer from process variations due to statistical variation in metal grain orientations at the gate, number of dopants in the substrate, thickness of the dielectric, etc. In addition to these 'time-zero' variation sources, presence of high oxide electric field and use of high-κ materials as dielectric (like silicon oxynitride and hafnium-based materials) strains the chemical bonds in the bulk and interface of the amorphous dielectric. As a result, defects are formed within the transistor, which leads to 'time-dependent' variation. Taken together, these 'time-zero' and 'time-dependent' phenomenon cause variation in transistor parameters (e.g., threshold voltage, mobility, sub-threshold slope, drain current) - which eventually lead to IC failure, when the variation goes beyond certain pre-defined limit. In this thesis, a physical model is developed to understand the defect formation at the dielectric/substrate interface of a transistor (a phenomenon, generally known as Negative Bias Temperature Instability), which is one of the major scaling concerns in current transistors. The time dynamics of interface defect generation is captured within a Reaction-Diffusion framework and hence compared with characteristic experimental signatures measured over a wide range of supply voltage, temperature, materials within the dielectric, and channel strain. This comprehensive analysis further establishes the subtleties in interface defect characterization using modern techniques and also explains the intricacies for analyzing the impact of defect generation in circuit level. More importantly, the study with interface defects has identified the presence of self-compensation in advanced CMOS technology. And such self-compensation is shown to be generally applicable for many sources of 'time-dependent' and 'time-zero' variabilities. Design of such variation-resilient transistor may reshape how circuits are designed and evaluated currently for handling process-induced (time-zero) and temporal (time-dependent) variations - which is one of the grand challenges for continuing transistor scaling following Moore's law. ------------------------ Ahmad Ehteshamul Islam PhD Candidate ECE, Purdue University http://web.ics.purdue.edu/~aeislam

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Annual Review: Monday, April 19 -- poster preparation
by Starewich, Deborah S. 14 Apr '10

14 Apr '10

Students must submit posters for the competition by April 15, 2010 to the front desk and register your poster(s) here: http://purdue.qualtrics.com/SE?SID=SV_1ND4oQbC1pNCSbO&SVID=Prod Use one of the Birck poster templates [24x36 or 36x24] located at: http://www.purdue.edu/discoverypark/nanotechnology/resources/PPT_resources.… Have your poster printed . . . MRGN Poster Printer Student workers are on hand in Morgan Thursday 9:30 a.m. – 11:30 a.m. If you don’t have your poster ready during the time above, please contact Melissa Schwartz, Annie Cheever, or Nancy to print your poster. Pick up a frame from Deborah’s office [BRK 1027], frame the poster and leave with Deborah for display during the poster session on Monday, April 19. Note the first 15 posters are guaranteed a frame; we can accept other posters as we have available frames. Let me know if you have any questions, Deborah

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SHELL ENERGY DAY at Purdue, ON BEHALF OF MARY JO BARTOLACCI
by Starewich, Deborah S. 13 Apr '10

13 Apr '10

[cid:3353999030_663233] SHELL ENERGY DAY AT PURDUE [cid:3353999030_675332] www.shell.us/energyday <http://www.shell.us/energyday> [cid:3353999030_660151] [cid:3353999030_638256] [cid:3353999030_640453] A Symposium on the Challenges of Building a Sustainable Energy Future [cid:3353999030_660554] Finding ways to extract oil from difficult-to-reach places. Creating a cleaner fuel for cars by turning natural gas to liquids. At Shell, we're developing all kinds of ideas to help meet the growing demand for energy. Join Shell and Purdue for a series of discussions that will explore energy sustainability, the future of energy, and the challenges we face in our attempt to meet the world's growing need for energy in a socially responsible manner. [cid:3353999030_666940] Date: April 21, 2010 Time: 8:00 AM – 4:00 PM (Lunch is provided) Location: Stewart Center, Rooms 302 and 306 Who Should Attend: Junior and senior chemical, mechanical and environmental engineering students; graduate-level geology and geophysics students; and faculty scientists and researchers. [cid:3353999030_636373] The full-day event will feature a keynote address by Jose Bravo, Chief Scientist - Chemistry & Catalysis, Shell Projects and Technology. Breakout sessions will feature Shell scientists and Purdue faculty, including Dr. John Bickham, Director for the Center of Environment at Purdue. Breakout session topics include: * Alaska – America's Frontier for Oil and Gas Exploration * CO2 – Managing Climate Impacts of Growing Energy Needs * Renewables – How Policy Impacts Economic Opportunities * Biofuels - Making Next Generation Opportunities Commercially Viable * Challenges of “Easy Oil” – Where Do We Go From Here and How Do We Get There A networking lunch and panel discussion will offer students the chance to meet with Shell recruitment staff to learn more about scholarships, internships and career opportunities. Register today, and together we can help build a responsible energy future. As you'd expect from a company ranked 12th in the 2009 ‘Times Top 100 Graduate Employers’ list, you'll have numerous opportunities to grow and develop your skills. Joining a company with more patents than NASA, you'll work alongside some of our greatest problem solvers, tackling live projects specifically matched to your interests and abilities. In addition to being paid, you'll also gain invaluable experience and regular feedback to help you build on your strengths. Plus, if you're successful, you could be offered a full-time position at Shell when you graduate, with no need for a further interview. Seats are limited, so. [cid:3353999030_681626] Kim Muldoon Corporate Relations Engineering Advancement College of Engineering Purdue University 765-494-3127 fax: 765-496-1466 ------ End of Forwarded Message

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