Advanced Metrology of Electronic Devices in Operating Mode Inside the Scanning Transmission Electron Microscope William A. Hubbard, CEO, NanoElectronic Imaging, Inc., CA Friday November 15th, 2024 @ 1:30 pm in BRK_1001 Zoom link to seminar https://purdue-edu.zoom.us/j/98487769216<https://nam04.safelinks.protection.outlook.com/?url=https%3A%2F%2Fpurdue-edu.zoom.us%2Fj%2F98487769216&data=05%7C02%7Cbnc-all%40ecn.purdue.edu%7C3b342219983841d7e7d808dd02924961%7C4130bd397c53419cb1e58758d6d63f21%7C0%7C0%7C638669549495120904%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=%2But0qzKun31ymcdGwK18BvV%2BQ9tRgT8JV6nBLvVC2xE%3D&reserved=0> [cid:image001.png@01DB3451.3D499770] -- Neil R. Dilley, Ph.D. Research Manager Birck Nanotechnology Center , Rm 1014 1205 Mitch Daniels Blvd. West Lafayette, IN 47907-2057 765-496-6080
