Advanced Metrology of Electronic Devices in Operating Mode Inside the Scanning Transmission Electron Microscope

William A. Hubbard, CEO, NanoElectronic Imaging, Inc., CA

Friday November 15th, 2024 @ 1:30 pm in BRK_1001

Zoom link to seminar

Neil R. Dilley, Ph.D.

Research Manager

Birck Nanotechnology Center , Rm 1014

1205 Mitch Daniels Blvd.

West Lafayette, IN 47907-2057

765-496-6080