From: Black, Nancy Lee Sent: Monday, March 30, 2015 9:36 AM To: Murray, Chris L; ecedraw@ecn.purdue.edu; Hatfield, Betty L.; Nahlik, Debra A; fergusoc@purdue.edud; Elwell, Cathy L; Blue, Rhonda E; Reece, Kellie A; Peoples, Timothy R; 'young55@purdue.edu'; Wable, Jill L; Ramsey, Christine M.; dpsite@ecn.purdue.edu; Anthrop, Heather L Cc: Zemlyanov, Dmitry Y Subject: FW: XPS / CASA XPS Workshop flyers and ads Good morning to all - could each of you post these workshop flyers in your buildings and add the body of this email and the flyers to either your website and/or email for all in your departments? Many thanks, Nancy Black, Secretary, BRK ************************ Dear Colleagues, I just want to attract your attention to two XPS workshop coming in May, 2015. I believe every research group using or planning to use Surface Analysis characterization tools should have at least one trained student. 1) Introduction to XPS workshop - What you should know about X-ray pohotoelectron spectroscopy (https://purdue.qualtrics.com/SE/?SID=SV_2aEjFISmtrn3IlD), May 19-20 @ 9:00 AM - BRK 1001. Course Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. The course will teach how and what information can be provided by XPS. 2) XPS Lite Workshop Introduction to CasaXPS (https://purdue.qualtrics.com/SE/?SID=SV_4ON5fLuUSipSyuV), May 26-27 @ 9:00 AM - BRK 1001. Course Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterizatio nof solid surface. however, XPS data require thorough analysis, and dedicated software is used for data analysis. purdue University has a site license for CasaXPS allowing complete analysis XPS data. The course aims to teach (1) what analysis should be applied to raw XPS data and (2) how this can be done using CasaXPS. Qualitative and quantitative analysis of XPS data using CasaXPS will be discussed in detail as well. Participants are encouraged to bring their own laptops to follow data analysis using CasaXPS. ************************ Please let me know if you have any questions. Thank you! Best regards, Dmitry ***************************************** Dmitry Zemlyanov, PhD Senior Research Scientist - Surface Science Application Purdue University Birck Nanotechnology Center, 1205 West State Street, West Lafayette, IN 47907-2057 Tel.: +1 (765) 496-2457 (office - BRK 1274) +1 (765) 496-6217 (lab - BRK 1077) Cell: +1 (765) 427-3813 Fax: +1 (765) 496-8299 mailto:dzemlian@purdue.edu web: https://nanohub.org/groups/bnc/equipment/category?class=characterization&id=...