From: Black, Nancy Lee Sent: Wednesday, May 29, 2013 2:29 PM To: Murray, Chris L; ecedraw@ecn.purdue.edu; Sanders, Cynthia J; Blakey, Pamela S; Ferguson, Cynthia L; Elwell, Cathy L; Blue-Boyer, Rhonda E; Reece, Kellie A Subject: FW: Nanofabrication Lecture Series at Purdue Univ. Could I ask each of you to send this lecture notification to those in your building whom may be interested? Thanks, Nancy Black, Secretary at Birck Nanotechnology Center [cid:_2_0DBEB6040DBEB09C0041985385257B74] Carl Zeiss Microscopy will host an informational lecture on nanofabrication techniques at Purdue Univ. on June 4, from 11:00 AM – 12:00 PM, in the Birck Nanotechnology Center, Rm. 2001. We ask that you reserve your spot<http://www.zeiss.com/nanofab-seminar> as the lectures will be followed by lunch and every registered attendee will receive a free t-shirt. “Advanced Gallium Focused Ion Beam Applications“ will explore new holders for the preparation of TEM samples, advanced three-dimensional sample analyses, extreme field of view imaging, and laser milling applications. “Helium and Neon FIB Microscopy for Sub-10nm Nanofabrication Applications“ will cover the new possibilities with ion microscopy. Learn about nanofabrication with highly sensitive materials, such as graphene, creation of solid state nanopores for DNA sequencing, direct write lithography down to 4nm, and deposition of conducting and insulating materials using inert ion species. RSVP<http://www.zeiss.com/nanofab-seminar>in order to reserve your lunch and ensure you will receive a free t-shirt. If you have any questions, please contact your account manager, Jon Cherry, at Jonathan.Cherry@zeiss.com<mailto:jonathan.cherry@zeiss.com?subject=Nanofabrication%20Lecture%20Series>. We look forward to seeing you on June 4. Sincerely, The Carl Zeiss Microscopy Team Editor: Shane Rourke Publisher: Carl Zeiss Microscopy, LLC One Zeiss Drive, Thornwood, NY 10594 Phone: 1-800-233-2343 To unsubscribe click here<http://emod-handler.crmondemand.com/ctd/globalunsub?LC=en&RECIP=test-rtoken&MRKID=test-marker-id> Contact the editor: shane.rourke@zeiss.com<mailto:shane.rourke@zeiss.com> [ZEISS Grey 2] ---------------------------------------- This message is intended for a particular addressee only and may contain business or company secrets. If you have received this email in error, please contact the sender and delete the message immediately. Any use of this email, including saving, publishing, copying, replication or forwarding of the message or the contents is not permitted.