From: Black, Nancy Lee
Sent: Wednesday, May 29, 2013 2:29 PM
To: Murray, Chris L; ecedraw@ecn.purdue.edu; Sanders, Cynthia J; Blakey, Pamela S; Ferguson, Cynthia L; Elwell, Cathy L; Blue-Boyer, Rhonda E; Reece, Kellie A
Subject: FW: Nanofabrication Lecture Series at Purdue Univ.

 

Could I ask each of you to send this lecture notification to those in your building whom may be interested?

Thanks, Nancy Black, Secretary at Birck Nanotechnology Center

 

 


 

 

Carl Zeiss Microscopy will host an informational lecture on nanofabrication techniques at Purdue Univ. on June 4, from 11:00 AM – 12:00 PM, in the Birck Nanotechnology Center, Rm. 2001.  We ask that you reserve your spot as the lectures will be followed by lunch and every registered attendee will receive a free t-shirt.

“Advanced Gallium Focused Ion Beam Applications“ will explore new holders for the preparation of TEM samples, advanced three-dimensional sample analyses, extreme field of view imaging, and laser milling applications.

“Helium and Neon FIB Microscopy for Sub-10nm Nanofabrication Applications“ will cover the new possibilities with ion microscopy. Learn about nanofabrication with highly sensitive materials, such as graphene, creation of solid state nanopores for DNA sequencing, direct write lithography down to 4nm, and deposition of conducting and insulating materials using inert ion species.

RSVPin order to reserve your lunch and ensure you will receive a free t-shirt.  If you have any questions, please contact your account manager, Jon Cherry, at Jonathan.Cherry@zeiss.com.

We look forward to seeing you on June 4.

Sincerely,

The Carl Zeiss Microscopy Team

 

Editor: Shane Rourke
Publisher: Carl Zeiss Microscopy, LLC
One Zeiss Drive, Thornwood, NY 10594
Phone: 1-800-233-2343
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