[cid:image005.png@01D1FEB0.79AFF950] Characterization of 2D materials at Birck Surface Analysis Facility Dmitry Zemlyanov, Ph.D. Senior Research Scientist Birck Nanotechnology Center Wednesday, September 21, 2016 2:00 p.m., WANG 1004 Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and Colleges of Science. I would like to demonstrate examples of the studies using X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy/spectroscopy (STM), high-resolution electron energy loss spectroscopy (HREELS), low energy electron diffraction (LEED). The applications of these techniques will be represented for the studies of 2D materials and thin films (graphene, phosphorene, BN, MoS2), atomic layer deposition and biologically-inspired surfaces (briefly).
