Forwarding on behalf of Birck Nanotechnology Center: Lisa Stacey Lead Administrative Assistant School of Materials Engineering Neil Armstrong Hall of Engineering o: 765-494-4095 f: 765-494-1204 [3749DD84]<https://nam04.safelinks.protection.outlook.com/?url=https%3A%2F%2Furldefense.proofpoint.com%2Fv2%2Furl%3Fu%3Dhttps-3A__www.purdue.edu_-3Futm-5Fsource-3Dsignature-26utm-5Fmedium-3Demail-26utm-5Fcampaign-3Dpurdue%26d%3DDwMFAg%26c%3Dl45AxH-kUV29SRQusp9vYR0n1GycN4_2jInuKy6zbqQ%26r%3DcYZgnbkB39R9SYPCvL_MkXuih1H-IjjKyRBtQtQ6ib8%26m%3DH5ec4nXIY6Mt-FgrmXhcB1ClcZZRWvtSm3BzPca31UE%26s%3Dra1N_tE4A3L7IxFqllrao41XR8k0ynZZYRxh3KMpTwY%26e%3D&data=05%7C02%7Cmsepostdoc-list%40ecn.purdue.edu%7C2b1ce86351a84c90e8ca08dd02c74ce7%7C4130bd397c53419cb1e58758d6d63f21%7C0%7C0%7C638669777192735734%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=hSCsAb41tg99jHkaPUj%2Bit4up68A1%2BdgJQMOvJltQac%3D&reserved=0> ________________________________ Advanced Metrology of Electronic Devices in Operating Mode Inside the Scanning Transmission Electron Microscope William A. Hubbard, CEO, NanoElectronic Imaging, Inc., CA Friday November 15th, 2024 @ 1:30 pm in BRK_1001 Zoom link to seminar https://purdue-edu.zoom.us/j/98487769216<https://nam04.safelinks.protection.outlook.com/?url=https%3A%2F%2Fpurdue-edu.zoom.us%2Fj%2F98487769216&data=05%7C02%7Cmsepostdoc-list%40ecn.purdue.edu%7C2b1ce86351a84c90e8ca08dd02c74ce7%7C4130bd397c53419cb1e58758d6d63f21%7C0%7C0%7C638669777192735734%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=vRPdKsJ2J79F7y4b8orf09MkL99kVZBh%2B7BLgJ%2B4RrQ%3D&reserved=0> [cid:image001.png@01DB3451.3D499770] -- Neil R. Dilley, Ph.D. Research Manager Birck Nanotechnology Center , Rm 1014 1205 Mitch Daniels Blvd. West Lafayette, IN 47907-2057 765-496-6080