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RA position at Birck FIB training and assistance and EM maintenance support The Birck Nanotechnology Center is looking for a Grad student with experience in scanning electron microscopy and focused ion beam to assist 20 hrs a week with the FIB at BNC - Helios 4G UX The responsibilities will be but not limited: 1. Provide FIB services - TEM sample preparation, patterning, cross section imaging and EDX chemical analysis - to BNC and industrial users using the FIB Helios 4G UX 2. Manage the reception of samples and analysis instructions from Birck users 3. Training new users in the FIB Helios 4G 4. Align the FIB monthly and make sure the system is working properly. 5. Provide assistance to users remotely in case an issue arises. 6. Manage the training and services request for FIB in Ilab and provide metrics every week. 7. Training new users in the Nanomill ion polisher, PIPS, and mechanical polisher. 8. Have great disposition, excellent communication skills, and ability to solve problems when providing services or trainings 9. Provide maintenance and support to the EM instrumentation 10. Prepare material for promoting the EM core in social media. Because of the nature of our Industrial clients, the succesful candidate needs to have export control clearence. Also, hours could be negociable but the succesfull candidate needs to be available from Tuesday until Saturday to work at BNC. Please send your resume and two letters of recommendation to rdiazri@purdue.edu<mailto:rdiazri@purdue.edu>. Best, ─────────────────────────────────── Rosa E. Diaz, PhD Electron Microscopy Research Scientist Birck Nanotechnology Center Purdue University 1205 W. State Street, West Lafayette, IN 47907-2057 Office: BRK-1272 Tel :765-496-1075 ───────────────────────────────────
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Turner, Jaime J