**Notice** Please plan on attending both days Keithley Seminar with Demos. Consult the attached template. There will be refreshments. This training session is based on the Keithley 4200-SCS Semiconductor Characterization System which has recently been purchased by Birck. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations. Thanks, Nancy Black Secretary Birck Nanotechnology Center 1205 West State Street West Lafayette, IN 47907-2057 (765) 494-8675 Email: blackn@purdue.edu