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ORGANIZER;CN="Gupta, Sumeet Kumar":mailto:guptask@purdue.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=FALSE;CN=ecefacult
 y@ecn.purdue.edu:mailto:ecefaculty@ecn.purdue.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=FALSE;CN='ecegrads
 tudent-list@ecn.purdue.edu':mailto:ecegradstudent-list@ecn.purdue.edu
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 cs-list@ecn.purdue.edu:mailto:ecepostdocs-list@ecn.purdue.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=FALSE;CN=BNC-EngSt
 aff:mailto:BNC-EngStaff@groups.purdue.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=FALSE;CN=bnc-facul
 ty-all-list@ecn.purdue.edu:mailto:bnc-faculty-all-list@ecn.purdue.edu
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=NEEDS-ACTION;RSVP=FALSE;CN=Biswajit 
 Ray:mailto:br0039@uah.edu
ATTACH:CID:5EDBE53F8CFCE947869E0CB9486C7000@namprd22.prod.outlook.com
DESCRIPTION;LANGUAGE=en-US:Hello\n\nIt is my great pleasure to host Prof. B
 iswajit Ray\, University of Alabama for his talk in the ECE Seminar Series
 . The details are below and attached. Hope to see you in the seminar.\n\nM
 any thanks to Prof. Alam for his kind suggestion.\n\nThanks\n\nSumeet\n\n\
 n\nWhen: June 3\, 2021 (Thursday)\, 9:30 AM – 10:30 AM (ET)\n\n\nWhere: 
 https://purdue-edu.zoom.us/j/3164232249\n\n\nTitle: 3D NAND based Storage 
 Systems for Hardware-security\, Reliability and Edge-computing\n\n\n\nAbst
 ract: Non-volatile memory such as NAND flash technology is ubiquitous in e
 lectronic systems that are used in many unmanned autonomous vehicles\, sen
 sor nodes\, space and defense electronics and internet of things applicati
 ons. While NAND flash memory offers high-density\, low-cost\, and light-we
 ight storage solutions in small form factors\, they suffer from security v
 ulnerabilities and reliability issues. Even though emerging non-volatile m
 emories offer high security and reliability\, they are limited in capacity
  (in Megabytes) and cost\, making them impractical for many emerging data-
 intensive applications\, such as artificial intelligence\, machine learnin
 g\, and predictive analytics. Thus\, there exists a need to enhance the se
 curity and reliability of the commercial-off-the-shelf (COTS) NAND flash m
 emory to enable data-intensive applications at the edge nodes and extreme 
 environments.\n\nIn this talk\, I will share my experimental research on t
 he security\, reliability and low-power computing using COTS 3D NAND flash
  memory. I will introduce a unique device-system interactive framework for
  3D NAND system which enables creation of hardware-security functions such
  as\, PUF\, TRNG\, Watermark\, true-sanitization and different anti-counte
 rfeit solutions. In addition\, I will illustrate the application of 3D NAN
 D for the future low-power computing systems. Finally\, I will present a c
 onceptual framework to understand the radiation effects on the 3D NAND sto
 rage and system-level error-mitigation strategies.\n\n\nSpeaker Bio: Biswa
 jit Ray is an Assistant Professor of Electrical and Computer Engineering w
 ith the University of Alabama in Huntsville\, AL\, USA\, where he leads Ha
 rdware Reliability Laboratory. Dr. Ray received Ph.D. from Purdue Universi
 ty\, West Lafayette\, IN and then he worked in SanDisk Corporation\, Milpi
 tas\, California developing 3D NAND Flash memory technology. Dr. Ray holds
  15 U.S. issued patents on non-volatile memory systems\, published more th
 an 50 research papers in international journals and conferences. Dr. Ray i
 s a senior member\, IEEE and the recipient of Outstanding Faculty Research
  Award (2020)\, The University of Alabama in Huntsville.\n\n\n
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SUMMARY;LANGUAGE=en-US:Webinar by Prof. Biswajit Ray\, U Alabama on "3D NAN
 D based Storage Systems for Hardware-security\, Reliability and Edge-compu
 ting"
DTSTART;TZID=Eastern Standard Time:20210603T093000
DTEND;TZID=Eastern Standard Time:20210603T103000
CLASS:PUBLIC
PRIORITY:5
DTSTAMP:20210531T185811Z
TRANSP:OPAQUE
STATUS:CONFIRMED
SEQUENCE:0
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