There will be a PUSPM seminar held this Friday, April 3rd in Brick 2001. A visiting speaker, Dr. Don Chernoff of the Advanced Surface Microscopy company (http://www.asmicro.com) will be giving a talk entitled: "Picometer-Scale Accuracy in Pitch Measurements using Microscopes." Pizza will be provided at 11:30 a.m. and the talk will begin at noon. Please see the attached seminar announcement for more information. Ryan Wagner PU-SPM student coordinator www.engineering.purdue.edu/PUSPM