Dear users, Hitachi's senior application engineer, Mr. Atsushi Muto, will be coming to Birck Nanotechnology Center for a one day workshop on our SEM S-4800. The workshop will consist on an introductory talk and two hands-on sessions morning and afternoon. The introductory talk will be from 9 a.m. to 9:45 a.m. in room BRK#1001. The morning hands-on session will start at 10 am and the afternoon hands-on session will start at 1pm, both in room BRK#1235. Main topics to be thought will be low voltage imaging, backscattered electron detection, STEM imaging, and sample preparation. I will have a sign up sheet at Heather's desk for you guys to sign up for either the morning or afternoon session. Best, Rosa ─────────────────────────────────── Rosa E. Diaz, PhD Electron Microscopy Research Scientist Birck Nanotechnology Center Purdue University 1205 W. State Street, West Lafayette, IN 47907-2057 Office: BRK-1272 Tel :765-496-1075 ─────────────────────────────────── Mr. Atsushi Muto Senior Application Engineer Hitachi High Technologies America [cid:image001.png@01D1C718.406B2040] BIOGRAPHICAL SKETCH Mr. Atsushi Muto is a Senior Applications Engineer in the Nanotechnology Systems Division of Hitachi High Technologies America, Inc., and works from the Clarksburg, MD, office. In his current role, he provides technical expertise, applications development and collaborative research activities. His research interests include FE-SEM system development, broad ion beam/focused ion beam applications and variable pressure electron microscopes. ABSTRACT The Hitachi S-4800 is an ultra-high resolution, field emission scanning electron microscope located in the Birck facility. An introductory talk will include a discussion and review of the imaging performance and capabilities of FE-SEM and will be followed up by hands on training sessions. This will include low voltage imaging, backscattered electron detection, and how to maximize imaging performance using the various detectors on the microscope. Sample preparation is also critical to quality results and we will discuss the latest in sample preparation techniques for UHR imaging.
