WEEKLY
MEMO, May 12, 2008
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1.
ANNOUNCEMENTS
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1.1: Summer
Project . . . Birck gets waxedJ: Is on hold
until further notice!
1.2: CARD READERS 2nd
FLOOR EAST: The BNC card reader system installation
is continuing on the
**2nd Floor EAST** wing (BRK 20XX) this week. Some cutting and grinding
can be expected as conduit and the card readers are mounted in the galley and
on each lab door (BRK 2031, 2037, 2043, 2077, 2081, & 2087).
The wiring and
installation work in the **2nd Floor West** has been completed.
If you have any issues
or concerns please contact Mary Jo Totten (61173) or Mark Voorhis (43036).
1.3: TOWN HALL
MEETING: Thursday, 05.15.08, 1:30, BRK 1001
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2.
TOURS/VISITORS
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3.
SEMINARS
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3.1:
“How Rain Starts” Friday, May 16, 2008; 4:00 p.m. Birck
Nanotechnology Center, Room 2001 Gregory Falkovich, Department Head, Physics of
Complex Systems, Weizmann Institute of Science, Israel and University of
Chicago.The brief history of rain theories, from primordial chaos to modern
turbulence, will be presented. Recent experimental and theoretical results on
fractal distribution of water droplets in clouds will be reviewed. Some
unsolved problems of cloud physics will be described along with their relations
to problems in field theory and condensed matter.Gregory Falkovich graduated
from Novosibirsk University, PhD from the Nuclear Physics Institute (Russian
Ac. Sci.,
Additional information
may be obtained from Gregory’s webpage
(http://www.weizmann.ac.il/home/fnfal/)
3.2: The
Olympus Nano-Imaging and Metrology Demonstration Series continues as a
participant with
Where:
When: Friday, May
23rd, 10:00 AM - 4:00 PM Bring samples for analysis!
The LEXT laser confocal
microscope system is specifically designed for industrial-based applications
requiring high-magnification and high-resolution 3D imaging and measurement.
The LEXT has lateral resolution of 120nm and Z-resolution of 10nm. It can
achieve magnifications up to 14,400x and can provide real color images, as well
as B&W laser images. It is ideal for metrology, surface analysis,
roughness, corrosion, failure analysis, and more. The LEXT is designed to
bridge the gap between a light microscope and an SEM in that:
-it
can achieve higher magnification and resolution than a light microscope
-it
can be used for brightfield, darkfield and DIC observations similar to a light
microscope
-it
is completely non-destructive
-easy
to operate, no special training required
-analyses
take minutes, no sample prep required
The LEXT has also been
recognized recently for two prestigious awards:
1. 2006:
The editors of Advanced Packaging gave the LEXT the award for "Best New
Product" as a Quality Assurance / Management Tool.
2. 2007:
Refreshments Served
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4.
OPPORTUNITIES
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